发明名称 ADSORBED GASIFICATION COMPONENT MEASURING DEVICE
摘要 PURPOSE: To highly precisely analyze all the gasification components qualitatively/quantitatively without using a standard reagent and an analytical curve by directly measuring the gasified component quantity emitted by heating a material to be measured as change in the weight of the material to be measured. CONSTITUTION: The distance of a material 20 to be measured at the tip of a coupling bar and a heater 4 is adjusted by adjusting the length of the coupling bar 5 so that the insides of a sample container 1 and a sealed container 2 are made to be vacuum by a vacuum pump 18. Secondarily, after the temperature of a pedestal 8 with a thermostatic mechanism is held at the optimum temperature (for example, 25 deg.C) for the action of a balance mechanism part 6, the total weight W0 of the material 20 before starting of the measurement and the coupling part 5 is calculated by controlling the mechanism part 6 by a control power supply part 14 and at the same time, residual gas component composition in the container 2 is measured and recorded by a gas component analyzer 11. And, the total weight W1 of the material 20 after the gasification component was emitted by heating with the heater 4, and the coupling bar 5 is measured and the total weight W0 before the start of the measurement is substrated from this so that the weightΔW of the emitted gasification component is quantitatively determined. At the same time, compound kind of the gasified component is qualitatively analyzed by the analyzer 11.
申请公布号 JPH08334449(A) 申请公布日期 1996.12.17
申请号 JP19950139724 申请日期 1995.06.06
申请人 JAPAN ATOM ENERGY RES INST 发明人 ABE TETSUYA;HIROKI SEIJI;MURAKAMI YOSHIO
分类号 G01N27/62;G01N5/04;G01N27/64;(IPC1-7):G01N5/04 主分类号 G01N27/62
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