发明名称 Lithographic apparatus and device manufacturing method
摘要 A porous member is used in a liquid removal system of an immersion lithographic projection apparatus to smooth uneven flows. A pressure differential across the porous member may be maintained at below the bubble point of the porous member so that a single-phase liquid flow is obtained. Alternatively, the porous member may be used to reduce unevenness in a two-phase flow.
申请公布号 US9507278(B2) 申请公布日期 2016.11.29
申请号 US201514806395 申请日期 2015.07.22
申请人 ASML NETHERLANDS B.V.;ASML HOLDING N.V. 发明人 Kemper Nicolaas Rudolf;Cox Henrikus Herman Marie;Donders Sjoerd Nicolaas Lambertus;de Graaf Roelof Frederik;Hoogendam Christiaan Alexander;Ten Kate Nicolaas;Leenders Martinus Hendrikus Antonius;Mertens Jeroen Johannes Sophia Maria;Van Der Meulen Frits;Ottens Joost Jeroen;Teunissen Franciscus Johannes Herman Maria;Van Der Toorn Jan-Gerard Cornelis;Verhagen Martinus Cornelis Maria;Polizzi Marco;Van Gompel Edwin Augustinus Matheus;Smeulers Johannes Petrus Maria;Belfroid Stefan Philip Christiaan;Vogel Herman
分类号 G03B27/52;G03B27/42;G03F7/20 主分类号 G03B27/52
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic projection apparatus configured to project a patterned beam onto a substrate using a projection system and configured to supply liquid to a space between the projection system and the substrate using a liquid supply system, the apparatus comprising: a substrate table configured to hold a substrate, the substrate table comprising a recess configured to receive the substrate, wherein the recess is larger than the substrate such that a trench is provided around an edge of the substrate when the substrate is held by the substrate table, the trench configured to collect at least part of the liquid; a liquid confinement member configured to at least partly confine the liquid in the space between the projection system and a surface of the substrate, the substrate table or both; and a removal opening comprising a porous member facing the substrate and vertically spaced apart from a bottom surface of the substrate, when the substrate is located under the projection system and the removal opening configured to remove at least part of the liquid through the porous member.
地址 Veldhoven NL