摘要 |
The transporting system is used to convey the test boards to a testing device (4), e.g. an oven, via transport carriages (1) with guide rails (2), for transporting parallel test boards at given relative spacings. The testing device has further guide rails (5), corresponding in number to the transport carriage guide rails, with the test boards transferred from the carriage guide rails to the testing device guide rails when the carriage is docked at the testing station. Pref. an automatic component mounting device is used for placing circuit components to be tested on the surface of the test boards. The docked transport carriages are electrically connected using corresp. connectors.
|
申请人 |
SIEMENS AG, 80333 MUENCHEN, DE |
发明人 |
HAUEIS, NORBERT, 93138 LAPPERSDORF, DE;EIGENSTETTER, PETER, 93093 DONAUSTAUF, DE;FALTERMEIER, JOSEF, 93179 BRENNBERG, DE;GRAFE, JUERGEN, DR., 01169 DRESDEN, DE |