发明名称 Spannungserzeugungs-Schaltung zum Testen integrierter Schaltungen
摘要 A voltage generating circuit provides little fluctuation of voltage to an IC load when the dynamic character of the IC is tested. In order to achieve this aim, a resistance is inserted between a power supply line and a feedback circuit after the static character of the IC is tested, and a current supply is set to draw current from the connecting point of the inserted resistance. The current supply inversely decreases or increases the amount of current drawn based upon the increment or the decrement of load current which flows through the inserted resistance.
申请公布号 DE19517373(C2) 申请公布日期 1997.04.24
申请号 DE1995117373 申请日期 1995.05.11
申请人 ADVANTEST CORP., TOKIO/TOKYO, JP 发明人 HASHIMOTO, YOSHIHERO, URAWA, SAITAMA, JP
分类号 G01R31/26;G01R1/28;G01R19/00;G01R31/30;G01R31/319;G05F1/618;(IPC1-7):G01R31/28 主分类号 G01R31/26
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