发明名称 WAFER TRANSFER CHAMBER AND PREHEATING METHOD FOR WAFER
摘要 PROBLEM TO BE SOLVED: To prevent a phenomenon in which a wafer develops warpage in a treatment chamber held at high temperature when the wafer is loaded into the chamber in a single-wafer-type treatment system that physically or chemically treats wafers in a high-temperature atmosphere. SOLUTION: A wafer transfer chamber 1 is located adjacent to treatment chambers 2, 3, and the wafer transfer mechanism in the wafer transfer chamber 1 transfers wafers from cassette chambers 4, 5 to the treatment chambers 2, 3. Transparent windows are formed above the wafer stop positions in the wafer transfer chamber 1, and infrared heaters 9, 10 are installed on the windows. The infrared heaters 9, 10 are used to preheat wafers.
申请公布号 JPH09115985(A) 申请公布日期 1997.05.02
申请号 JP19950275836 申请日期 1995.10.24
申请人 TOSHIBA MACH CO LTD 发明人 SUGIYAMA HISATAKA;HAYASHI SHINGO
分类号 B65G49/07;B01J19/00;H01L21/205;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G49/07
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