发明名称 Mask ROM process for making a ROM with a trench shaped channel
摘要 A memory cell, and process for making it, having a long channel and narrow buried bit line is disclosed. The memory cell is formed in a substrate having a first dopant type. A trench is defined in the substrate. Source/drain regions of a second dopant type are formed on the surface of the substrate to each side of the trench. A gate oxide layer is formed over the substrate and a polysilicon wordline deposited over the gate oxide layer. A channel is defined along the walls of the trench. Ions are implanted in the bottom of the trench defining the channel for a cell that is selected to be in the off state. The long channel and narrow bit line of these memory cells overcome the problem of high bit line resistance and low junction breakdown voltage found in conventional memory cells.
申请公布号 US5627091(A) 申请公布日期 1997.05.06
申请号 US19940251979 申请日期 1994.06.01
申请人 UNITED MICROELECTRONICS CORPORATION 发明人 HONG, GARY
分类号 H01L21/8246;(IPC1-7):H01L21/265 主分类号 H01L21/8246
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