发明名称 Silicon On Insulator structure with single crystal semiconductor substrate
摘要 The SOI structure has a single crystal semiconductor substrate (1), an insulating layer (2) formed on this substrate and a single crystal semiconductor layer (32) formed on the insulating layer and a quasi grain barrier (7). The SOI structure has a highly doped section (40), which contains a higher concentration of impurities than the remaining region in the semiconductor layer (32), and is formed in a region, which contains the quasi grain barrier (7). The concentration of the impurities of the highly doped section (40) in the single crystal semiconductor layer (32), amounts to not less than 4 x 10x17 cm-3.
申请公布号 DE19624278(A1) 申请公布日期 1997.06.12
申请号 DE1996124278 申请日期 1996.06.18
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 YAMAGUCHI, YASUO, TOKIO/TOKYO, JP
分类号 G01L9/04;G01L1/22;G01L9/00;H01L21/02;H01L21/20;H01L27/12;H01L29/84;(IPC1-7):H01L27/12;H01L21/84;G01L9/02 主分类号 G01L9/04
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