发明名称 |
Silicon On Insulator structure with single crystal semiconductor substrate |
摘要 |
The SOI structure has a single crystal semiconductor substrate (1), an insulating layer (2) formed on this substrate and a single crystal semiconductor layer (32) formed on the insulating layer and a quasi grain barrier (7). The SOI structure has a highly doped section (40), which contains a higher concentration of impurities than the remaining region in the semiconductor layer (32), and is formed in a region, which contains the quasi grain barrier (7). The concentration of the impurities of the highly doped section (40) in the single crystal semiconductor layer (32), amounts to not less than 4 x 10x17 cm-3.
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申请公布号 |
DE19624278(A1) |
申请公布日期 |
1997.06.12 |
申请号 |
DE1996124278 |
申请日期 |
1996.06.18 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
YAMAGUCHI, YASUO, TOKIO/TOKYO, JP |
分类号 |
G01L9/04;G01L1/22;G01L9/00;H01L21/02;H01L21/20;H01L27/12;H01L29/84;(IPC1-7):H01L27/12;H01L21/84;G01L9/02 |
主分类号 |
G01L9/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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