发明名称 IMAGE-BINARIZING METHOD AND SURFACE-DEFECT INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To enable a proper binarization by performing specified calculation for calculating a threshold value on the basis of physical quantity regarding noises occurring at an edge detection process image. SOLUTION: The upper limit value and the lower limit value within a range of brightness level where noise is generated are set. Then, an average value Navg in the range is obtained. Then, as in the equation, for example, Th= kμNavg, the noise average value Navg is multiplied with a specified factor k, so that a threshold value Th which is larger than noise level and smaller than edge level is calculated. Factor, equation, and noise's upper limit/lower limit values are determined experimentally in advance. By binarizing with thus obtained threshold value, only edge can be detected.
申请公布号 JPH09318334(A) 申请公布日期 1997.12.12
申请号 JP19960131585 申请日期 1996.05.27
申请人 NISSAN MOTOR CO LTD 发明人 IMANISHI MASANORI;YOSHIDA KIYOSHI;ASAE TERUO;SUZUKI YUTAKA;TSUJI MASABUMI
分类号 G01B11/30;(IPC1-7):G01B11/30 主分类号 G01B11/30
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