发明名称 DEVICE AND METHOD FOR EVALUATING DELAY FOR CIRCUIT NOT DEPENDING ON TECHNOLOGY
摘要 PROBLEM TO BE SOLVED: To exactly find circuit delay in a short time in optimizing processing of a logic circuit at a technology notdepending level. SOLUTION: While paying attention onto one path a→b→c→d→e in an object circuit, this path is mapped by library cells ao 21 and aoi 21 having the same path pattern. Then, the delay of path a→b inside the cell ao 21 is added with the delay of path c→d→e inside the cell aoi 21 and the delay of path a→b→c→d→e is found. The existence of consistency between such path mapping and technology mapping is shown and high-accuracy delay value is found. Besides, since mapping is performed while paying attention only upon the path, this mapping is extremely accelerated rather than technology mapping.
申请公布号 JPH09325986(A) 申请公布日期 1997.12.16
申请号 JP19970083129 申请日期 1997.04.01
申请人 FUJITSU LTD 发明人 TAMIYA YUTAKA
分类号 G01R31/28;G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G01R31/28
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