发明名称 |
THREE DIMENSIONAL MEMORY AND METHODS OF FORMING THE SAME |
摘要 |
Some embodiments include a memory device and methods of forming the memory device. One such memory device includes a first group of memory cells, each of the memory cells of the first group being formed in a cavity of a first control gate located in one device level of the memory device. The memory device also includes a second group of memory cells, each of the memory cells of the second group being formed in a cavity of a second control gate located in another device level of the memory device. Additional apparatus and methods are described. |
申请公布号 |
US2016300850(A1) |
申请公布日期 |
2016.10.13 |
申请号 |
US201615188273 |
申请日期 |
2016.06.21 |
申请人 |
Micron Technology, Inc. |
发明人 |
Tang Sanh D.;Zahurak John K. |
分类号 |
H01L27/115;H01L23/528;G11C16/10;G11C16/14;G11C13/00;H01L27/24;G11C16/26 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus comprising:
first memory cells located in a first device level of a memory device; second memory cells located in a second device level of the memory device; a first control gate formed in the first device level, the first control gate to control access to the first memory cells, wherein each of the first memory cells includes a memory element formed in a cavity of the first control gate; and a second control gate formed in the second device level, the second control gate to control access to the second memory cells, wherein each of the second memory cells includes a memory element formed in a cavity of the second control gate. |
地址 |
Boise ID US |