发明名称 Element analysis arrangement for material using X-ray fluorescence
摘要 The arrangement includes an X-ray radiation source, whose radiation is directed at a sample arranged on a test carrier. The resulting fluorescence radiation emitted by the sample is recorded by at least one radiation detector. The radiation detector (16) is formed through a CCD-X-ray radiation detector, whereby a number of radiation detectors are preferably arranged around the sample.
申请公布号 DE19644936(A1) 申请公布日期 1998.05.07
申请号 DE1996144936 申请日期 1996.10.29
申请人 GKSS-FORSCHUNGSZENTRUM GEESTHACHT GMBH, 21502 GEESTHACHT, DE 发明人 SCHWENKE, HEINRICH, 21039 ESCHEBURG, DE;KNOTH, JOACHIM, 21029 HAMBURG, DE;SCHNEIDER, HARALD, 21502 GEESTHACHT, DE;BEAVEN, PETER, 21465 REINBEK, DE
分类号 G01N23/207;G01N23/223;(IPC1-7):G01N23/223 主分类号 G01N23/207
代理机构 代理人
主权项
地址