发明名称 WAFER TAKE OUT APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a wafer take out apparatus capable of surely detecting wafers doubly taken out even in a worse environment. SOLUTION: A wafer Wa taken out from a cassette is laid on a susceptor 84. This causes the susceptor to be loaded in the gravitational direction. A load sensor 83 detects the load on the susceptor to output the load value to a CPU 87 which compares it with a previously input reference value to judge if wafers are doubly taken out. If the wt. of one wafer is set to a reference value, the CPU judges that wafers are doubly taken out when the detected wt. exceeds the reference.
申请公布号 JPH10125759(A) 申请公布日期 1998.05.15
申请号 JP19960276060 申请日期 1996.10.18
申请人 TOKYO SEIMITSU CO LTD 发明人 NAKAURA KENICHI
分类号 B65G59/04;B65H3/08;B65H7/12;H01L21/677;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65G59/04
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