| 摘要 |
An arrangement and a method are presented for measuring the thickness of a layer (7) by means of a layer thickness measurer (1) which incorporates a measuring device (2) which is intended to be applied to the layer whose thickness is to be measured. The arrangement incorporates means (8,9) adapted to accommodating said layer thickness measurer (1) and a film (11) which is arranged on said means and which is adapted to being situated between said measuring device (2) and the layer (7) whose thickness is to be determined. <IMAGE> |
