| 摘要 |
The invention relates to a method for the determination, at least in regions, of a contour of at least one additively manufactured component layer, in which a contour line of the component layer is traveled over, at least in regions, by a laser beam, and a time exposure of the traveled contour line is produced by a camera system. The invention further relates to a device for the determination, at least in regions, of a contour of at least one additively manufactured component layer. For this purpose, the device comprises at least one laser system, by which a contour line of the component layer can be traveled over, at least in regions, by a laser beam, and a camera system, which is designed to produce a time exposure of the contour line traveled over by the laser beam. |
| 主权项 |
1. A method for the determination, at least in regions, of a contour of at least one additively manufactured component layer (10), comprising the steps of:
traveling over a contour line (14) of the component layer (10), at least in regions, by a laser beam (16); and producing a time exposure (22) of the traveled contour line (14) by a camera system (18). |
