发明名称 Ultra-low particle semiconductor cleaner
摘要 A method for cleaning a semiconductor wafer. The method includes immersing a wafer in a liquid including water. The wafer has a front face, a back face, and an edge. The method also includes providing a substantially particle free environment adjacent to the front face and the back face as the liquid is being removed. A step of introducing a carrier gas including a cleaning enhancement substance during the providing step also is included. The cleaning enhancement substance dopes the liquid which is attached to the front face and the back face to cause a concentration gradient of the cleaning enhancement substance in the attached liquid to accelerate fluid flow of the attached liquid off of the wafer.
申请公布号 US5891256(A) 申请公布日期 1999.04.06
申请号 US19970861456 申请日期 1997.12.29
申请人 YIELDUP INTERNATIONAL 发明人 MOHINDRA, RAJ;BHUSHAN, ABHAY;BHUSHAN, RAJIV;PURI, SURAJ;ANDERSON, SR., JOHN H.;NOWELL, JEFFREY
分类号 B08B7/04;B08B3/10;G11B23/50;H01L21/00;H01L21/027;H01L21/304;H01L21/306;(IPC1-7):B08B3/04;B08B5/00 主分类号 B08B7/04
代理机构 代理人
主权项
地址