Integrated circuit testing architecture

摘要

In accordance with one aspect of the present description, an interface between an integrated circuit device and a test controller for testing the integrated circuit device includes a plurality of boards coupled together. In one embodiment, the test interface includes a plurality of interchangeable auxiliary boards, each having test circuitry, which may be coupled to a primary board and reused as appropriate to test various integrated circuits. Other aspects are described.

主权项

1. A method, comprising:
testing a first integrated circuit device using a test controller and a test interface coupled to the test controller, the first device testing comprising: using the test controller, generating test signals; using a primary test interface board of the test interface, forwarding test signals from the test controller to a first removable primary product board of the test interface connected to the primary test interface board by board edge connectors, the first removable primary product board having forwarding circuitry and having the first integrated circuit device under test disposed in a socket on the first removable primary product board, and forwarding test response signals from the first removable primary product board back to the test controller; forwarding test signals from test circuitry of a first removable auxiliary test interface board connected to the primary test interface board, to the first removable primary product board, for testing the first integrated circuit device under test disposed on the first removable primary product board; using the forwarding circuitry of the first removable primary product board, forwarding test signals from test circuitry of a first removable auxiliary product board connected to the first removable primary product board, for testing an integrated circuit device under test disposed on the first removable primary product board; and reconfiguring the test interface to test a second, different integrated circuit device.