发明名称 |
Temperature band operation logging |
摘要 |
In a system, temperature measurements are logged. From the logged measurements, duration of operation of the system in each of a plurality of temperature bands is determined. |
申请公布号 |
US9506815(B2) |
申请公布日期 |
2016.11.29 |
申请号 |
US201114125739 |
申请日期 |
2011.06.27 |
申请人 |
Hewlett Packard Enterprise Development LP |
发明人 |
Moore David A;Faasse Scott P.;Plank Jeffrey A.;Cader Tahir |
分类号 |
G01K3/00;G01K3/04;G06F1/20;H05K7/20 |
主分类号 |
G01K3/00 |
代理机构 |
Hewlett Packard Enterprise Patent Department |
代理人 |
Hewlett Packard Enterprise Patent Department |
主权项 |
1. A method comprising:
periodically measuring, via a temperature sensor, a temperature proximate or within a system; compiling, via a temperature band duration logging unit, temperature measurements into logged temperature duration bands that indicate a duration at which measured temperatures are associated with individual temperature duration bands; calculating, via a processor, a risk index from at least one logged temperature duration band; and performing, via the processor, a policy-based action based on the risk index. |
地址 |
Houston TX US |