发明名称 Temperature band operation logging
摘要 In a system, temperature measurements are logged. From the logged measurements, duration of operation of the system in each of a plurality of temperature bands is determined.
申请公布号 US9506815(B2) 申请公布日期 2016.11.29
申请号 US201114125739 申请日期 2011.06.27
申请人 Hewlett Packard Enterprise Development LP 发明人 Moore David A;Faasse Scott P.;Plank Jeffrey A.;Cader Tahir
分类号 G01K3/00;G01K3/04;G06F1/20;H05K7/20 主分类号 G01K3/00
代理机构 Hewlett Packard Enterprise Patent Department 代理人 Hewlett Packard Enterprise Patent Department
主权项 1. A method comprising: periodically measuring, via a temperature sensor, a temperature proximate or within a system; compiling, via a temperature band duration logging unit, temperature measurements into logged temperature duration bands that indicate a duration at which measured temperatures are associated with individual temperature duration bands; calculating, via a processor, a risk index from at least one logged temperature duration band; and performing, via the processor, a policy-based action based on the risk index.
地址 Houston TX US