发明名称 Probe scanning mechanism for a scanning probe microscope
摘要 A cantilever is attached to a moving block by means of a holder. Three sapphire plates are provided at a corner of the moving block so that their respective planes extend at right angles to one another. Three piezo-actuators are displaceable in directions intersecting at right angles to one another, and fixed with their one ends to stationary tables, respectively. Sapphire plates are attached individually to the respective other ends of the piezo-actuators. Each sapphire plate faces its corresponding sapphire plate on the moving block with ruby spheres between them. Two attracting magnets are attached individually to the respective sapphire plates at the center. The magnets face each other with a narrow enough space of, e.g., several micrometers between them.
申请公布号 US5912461(A) 申请公布日期 1999.06.15
申请号 US19960713731 申请日期 1996.09.13
申请人 OLYMPUS OPTICAL CO., LTD. 发明人 ANDO, TOSHIO;HAYASHI, YOSHIAKI
分类号 G01B21/30;G01N37/00;G01Q10/00;G01Q10/04;G01Q60/24;G01Q70/02;G01Q90/00;H01J37/20;H01J37/28;(IPC1-7):H01J37/20 主分类号 G01B21/30
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