发明名称 Installation for washing substrates during manufacture of semiconductor components
摘要 The substrate washing installation is characterized by: (a) cleaning element (53) which lets through liquids, is in contact with an essentially horizontal substrate, and moves relative to the substrate; (b) carrier (30) for the cleaning element; (c) supply unit (92) for delivery of the cleaning liquid to delivery line (12); (d) means for pressing the cleaning element against the substrate; and (e) means (91, 93, 94, 95) for relative horizontal motion between the cleaning element and the substrate. An Independent claim includes method involving holding of the substrate essentially in a horizontal orientation, delivery of a cleaning liquid through the cleaning element onto the substrate surface, pressing of the cleaning element against the substrate surface, and horizontal displacement of the cleaning element relative to the substrate.
申请公布号 DE19860731(A1) 申请公布日期 1999.07.22
申请号 DE19981060731 申请日期 1998.12.30
申请人 TOKYO ELECTRON LTD., TOKIO/TOKYO, JP 发明人 HIROSE, KEIZO, KOFU, YAMANASHI, JP;SEKIGUCHI, KENJI, KOFU, YAMANASHI, JP
分类号 B08B1/04;B08B3/04;B08B3/08;B08B3/12;B08B7/04;H01L21/00;H01L21/304;H01L21/306;(IPC1-7):H01L21/302 主分类号 B08B1/04
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