发明名称 |
Installation for washing substrates during manufacture of semiconductor components |
摘要 |
The substrate washing installation is characterized by: (a) cleaning element (53) which lets through liquids, is in contact with an essentially horizontal substrate, and moves relative to the substrate; (b) carrier (30) for the cleaning element; (c) supply unit (92) for delivery of the cleaning liquid to delivery line (12); (d) means for pressing the cleaning element against the substrate; and (e) means (91, 93, 94, 95) for relative horizontal motion between the cleaning element and the substrate. An Independent claim includes method involving holding of the substrate essentially in a horizontal orientation, delivery of a cleaning liquid through the cleaning element onto the substrate surface, pressing of the cleaning element against the substrate surface, and horizontal displacement of the cleaning element relative to the substrate.
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申请公布号 |
DE19860731(A1) |
申请公布日期 |
1999.07.22 |
申请号 |
DE19981060731 |
申请日期 |
1998.12.30 |
申请人 |
TOKYO ELECTRON LTD., TOKIO/TOKYO, JP |
发明人 |
HIROSE, KEIZO, KOFU, YAMANASHI, JP;SEKIGUCHI, KENJI, KOFU, YAMANASHI, JP |
分类号 |
B08B1/04;B08B3/04;B08B3/08;B08B3/12;B08B7/04;H01L21/00;H01L21/304;H01L21/306;(IPC1-7):H01L21/302 |
主分类号 |
B08B1/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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