X-ray detection apparatus

摘要

X-ray imaging apparatus, which includes an x-ray detector. The x-ray detector comprises a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the said structure comprises at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

主权项

1. X-ray imaging and materials identification apparatus, the apparatus including an x-ray detector comprising:
a single member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, wherein the single member, the position for a material under test, the x-ray source, and the structure configured to perturb an x-ray energy spectrum each lie on a common axis, wherein: the x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and the position for material under test, said structure lies between the x-ray source and the single member to one side of the position for material under test intersecting the common axis, the structure configured to perturb an x-ray energy spectrum comprises at least three adjacent regions, each different from each other and having a different x-ray energy spectrum perturbing characteristic, and a difference between adjacent regions of the structure configured to perturb the x-ray energy spectrum includes the thickness of the material of the structure in adjacent regions.