| 发明名称 | Thermographic inspection system | ||
| 摘要 | A thermographic inspection system includes a heat source configured to be removably attached to an exterior surface of an object. A thermal imaging device obtains a thermal image of the object, and an analyzing device determines a location of a defect in the object based on the thermal image. | ||
| 申请公布号 | US9518946(B2) | 申请公布日期 | 2016.12.13 |
| 申请号 | US201314097143 | 申请日期 | 2013.12.04 |
| 申请人 | WATLOW ELECTRIC MANUFACTURING COMPANY | 发明人 | Nosrati Mohammad;Swanson Cal;Ptasienski Kevin;Smith Kevin R.;Steinhauser Louis P. |
| 分类号 | G01N25/72;G01J5/00;G01N25/18 | 主分类号 | G01N25/72 |
| 代理机构 | Burris Law, PLLC | 代理人 | Burris Law, PLLC |
| 主权项 | 1. A thermographic inspection system comprising: a heat source configured to be removably attached to an exterior surface of an object; a thermal imaging device that obtains a thermal image of the heat source; and an analyzing device that determines a location of a defect in the object based on the thermal image, wherein the heat source is disposed between the object and the thermal imaging device, and wherein the analyzing device determines a surface temperature of the heat source to determine the location of the defect in the object when the heat source is attached to the object. | ||
| 地址 | St. Louis MO US | ||