发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To perform fitting adjustment to the input/output parameter of a connecting part at a lower cost by connecting capacitive elements arranged in a dummy structure with a connection pad, corresponding to output signal characteristic. SOLUTION: In order to fit and adjust the input/output parameter of a connecting surface 1 for a semiconductor integrated circuit to external line and conductor, a part of capacitive elements arranged in a dummy structure is used, e.g. a modular structure for the capacitive elements in the dummy structure is formed. In the dummy structure, parts of the capacitive elements 34,..., 37 are connected with a connection pad 1 via a symbolically shown connecting line 39, corresponding to desired capacitance space factor of the connection pad 1. The connecting line 39 is stretched as a metal conductor path in a wiring plane above a polysilicon section. A separable protective fuse or a switching element is arranged additionally, and after the formation or when necessary, desired capacitance value is adjusted or set during operation of the semiconductor circuit.
申请公布号 JP2000012786(A) 申请公布日期 2000.01.14
申请号 JP19990161146 申请日期 1999.06.08
申请人 SIEMENS AG 发明人 SAVIGNAC DOMINIQUE;FEURLE ROBERT;SCHNEIDER HELMUT
分类号 H01L27/04;H01L21/82;H01L21/822;H01L23/16;H01L23/525;(IPC1-7):H01L27/04 主分类号 H01L27/04
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