发明名称 |
DESIGNING METHOD FOR FACILITATING CHECK FOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To facilitate the generation of a check sequence rather than a conventional case concerning a designing method for facilitating check for identifying a scanning FF. SOLUTION: An FF relation graph is prepared from an integrated circuit (SA1) and after FF composing of a self-loop are recognized from this FF relation graph (SA2), all the FF are scanned (SA3). According to a prescribed evaluation index expressing the degree of relation with difficulty in the check sequence generation, all the FF not composing of the self-loop are sorted (SA4). For example, an index expressing the degree of relation with a balance reconverging structure is used as the evaluation index. When it is assumed that the respective FF not composing of the self-loop are not scanned in this sort order, it is discriminated whether the integrated circuit is made into n-times arranged structure or not and it is determined whether or not the FF are to be scanned (SA5-SA8).
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申请公布号 |
JP2000067105(A) |
申请公布日期 |
2000.03.03 |
申请号 |
JP19990106082 |
申请日期 |
1999.04.14 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HOSOKAWA TOSHINORI;HIRAOKA TOSHIHIRO |
分类号 |
G01R31/28;G01R31/3185;G06F17/50;(IPC1-7):G06F17/50 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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