发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To confirm the precision of a bait-in A/D converter in an LSI even if an inexpensive tester is used. SOLUTION: An A/D converter 5 of 8 bits, for example, digitally converts an input ramp wave and supplies the output codes of 0 to 255 steps in resolution to a matching detection circuit 9. A reference value setting circuit 7 supplies one value to the matching detection circuit 9 for every ramp wave input period based on a reference setting signal from a tester 21 which does not incorporate DSP. The reference value setting circuit 7 sequentially supplies the values of 1-254 to the matching detection circuit 9 in accordance with 254 ramp wave inputs. The matching detection circuit 9 supplies detection period signals (continuous high signals) of a period when the output code from the A/D converter 5 is matched with a value from the reference value setting circuit 7 at every ramp wave input to the tester 21. The tester 21 counts to how many clocks the detection period signal continues.
申请公布号 JP2000078007(A) 申请公布日期 2000.03.14
申请号 JP19980241473 申请日期 1998.08.27
申请人 TOSHIBA CORP 发明人 MURAMATSU KUNIO
分类号 H03M1/10;(IPC1-7):H03M1/10 主分类号 H03M1/10
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