发明名称 METHOD AND DEVICE FOR CORRECTING DETECTOR ERROR IN TEST WITH LIMITED ACCESS
摘要 PROBLEM TO BE SOLVED: To measure the voltage of a board having inaccessible nodes with measurement errors by calculating a set of the minimum delta and maximum delta from the minimum value and maximum value of the measured voltages for a set of nodes of a circuit, and utilizing them as the constraint on the linear programming problem for optimizing an objective function. SOLUTION: The resistance between a circuit board and a probe pin varies in each test of the circuit board, thus the resistance Zi, Zg may possibly vary, and the values of capacitances yd, ys vary on every different measuring point. The reference node voltage Vg on the board, the simulation voltage Vs applied to the board and the voltage Vr applied between both ends of a reference resistor from a power supply 1104 are measured in addition to the measurement of the node voltages of accessible nodes of the board under test (component assembly 1102). The voltage Vr is corrected not to be affected by the capacitances yd, ys of a detector 1110 in measuring.
申请公布号 JP2000121699(A) 申请公布日期 2000.04.28
申请号 JP19990290334 申请日期 1999.10.12
申请人 AGILENT TECHNOL INC 发明人 AHRIKENCHEIKH CHERIF;BROWEN RODNEY A;DARBIE WILLIAM P;MCDERMID JOHN E
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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