发明名称 IMMUNOANALYTICAL METHOD
摘要 PROBLEM TO BE SOLVED: To provide a measuring method in which a high-value specimen can be measured while the sensitivity of a low-value specimen is being ensured in immunoassay. SOLUTION: In homogeneous immunoassay, a measurement in two points whose reaction time is different is performed for one measurement, a measured value whose reaction time is short is designated as T1, and a measured value whose reaction time is long is designated as T2. When the T1 of a sample to be inspected is at a preset threshold value A or lower, the reaction amount of the sample to be inspected is calculated by using a first expression of (reaction amount of sample to be inspected) = (T2 of sample to be inspected). When the T1 of the sample to be inspected exceeds the threshold value A, the reaction amount of the sample to be inspected is calculated by using a second expression of (reaction amount of sample to be inspected) = (T2 of sample to be inspected)×(T1 of sample to be inspected)/A.
申请公布号 JP2001033451(A) 申请公布日期 2001.02.09
申请号 JP19990208242 申请日期 1999.07.22
申请人 SYSMEX CORP 发明人 TSUCHIYA HIROSHI;SHINKAI ETSURO
分类号 G01N33/542;(IPC1-7):G01N33/542 主分类号 G01N33/542
代理机构 代理人
主权项
地址