发明名称 |
METHOD FOR PERFORMING SEMICONDUCTOR WET PROCESS FOR PREVENTING PARTICLES AND APPARATUS FOR PERFORMING WET PROCESS USING THE SAME |
摘要 |
PURPOSE: A method for performing a semiconductor wet process for preventing particles is provided to prevent particles from being adhered to a wafer by electrostatic force during a wet process. CONSTITUTION: A cassette(20) on which a wafer is mounted is positioned in an orient flat zone. Ions are generated in the cassette to reduce electrostatic force on the wafer so that particles are prevented from being adhered to the wafer. A roller(30) is transferred from a lower portion of the cassette to be closely adhered to the flat zone of the wafer. The roller is revolved to rotate the wafer while a semiconductor wet process is performed. The ion generation is stopped when the wafer is disposed in the position of the flat zone while descending the roller.
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申请公布号 |
KR20010036505(A) |
申请公布日期 |
2001.05.07 |
申请号 |
KR19990043535 |
申请日期 |
1999.10.08 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, HUI CHAN |
分类号 |
H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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