发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having proper characteristics in burying a contact plug in a contact hole and hence preventing short circuiting to an upper layer and increase in contact resistance between the contact plug and the lower layer. SOLUTION: A semiconductor device has a first connection layer 1, an interlayer insulating film 2 formed on the first connection layer 1, a second connection layer (3a, 3b) formed on the interlayer insulating film 2, and contact plugs (4a, 4b) formed in the interlayer insulating film 2 and connecting the first connection layer 1 to the second connection layer (3a, 3b). Each of the contact plugs (4a, 4b) has a slanted portion 6, having a sidewall 5 slantingly widened toward the second connection layer (3a, 3b) and a top end surface (7a, 7b) whose diameter 9 is smaller than the largest diameter 8 to the slanted portion 6.
申请公布号 JP2001274240(A) 申请公布日期 2001.10.05
申请号 JP20000082145 申请日期 2000.03.23
申请人 TOSHIBA ENG CO LTD;CHUBU TOSHIBA ENGINEERING KK;TOSHIBA CORP 发明人 NAKAMURA SHUICHI;TOSHIMA HIROYUKI;SHODA HISAHIRO;SUWA YUTAKA;OMORI TAKAO
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/768;H01L23/522;(IPC1-7):H01L21/768;H01L21/306 主分类号 H01L21/28
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