发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a process for manufacturing a semiconductor device formed on a substrate which comprises a semiconductor film of large crystal grain size of good crystallinity with the position of crystal grain boundary of a channel formation layer being controlled for good characteristics and less variation. SOLUTION: On a quartz substrate 11, a gate electrode 12 is formed, and then a gate insulating film 13 is formed before a semiconductor film 14 is formed. YAG2ωlaser 15 is projected from the semiconductor film 14 side.
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申请公布号 |
JP2001284595(A) |
申请公布日期 |
2001.10.12 |
申请号 |
JP20000096228 |
申请日期 |
2000.03.31 |
申请人 |
SEIKO EPSON CORP;MITSUBISHI ELECTRIC CORP |
发明人 |
JIROKU HIROAKI;MIYASAKA MITSUTOSHI;OGAWA TETSUYA;TOKIOKA HIDETADA |
分类号 |
H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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