发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a process for manufacturing a semiconductor device formed on a substrate which comprises a semiconductor film of large crystal grain size of good crystallinity with the position of crystal grain boundary of a channel formation layer being controlled for good characteristics and less variation. SOLUTION: On a quartz substrate 11, a gate electrode 12 is formed, and then a gate insulating film 13 is formed before a semiconductor film 14 is formed. YAG2ωlaser 15 is projected from the semiconductor film 14 side.
申请公布号 JP2001284595(A) 申请公布日期 2001.10.12
申请号 JP20000096228 申请日期 2000.03.31
申请人 SEIKO EPSON CORP;MITSUBISHI ELECTRIC CORP 发明人 JIROKU HIROAKI;MIYASAKA MITSUTOSHI;OGAWA TETSUYA;TOKIOKA HIDETADA
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/20
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