发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To enable formation of a contact of a silicon substrate having low contact resistance without increasing leakage current. SOLUTION: When a contact is formed in a silicide layer formed on a silicon substrate, a metallic nitride film comprising metallic halogen compound is formed and heat treatment is carried out. Consequently, halogen atom is desorbed by decomposing halogenide and metallic atom coupled to halogen is diffused to a silicon substrate side, and a natural oxide film on a silicon substrate is reduced.
申请公布号 JP2001284287(A) 申请公布日期 2001.10.12
申请号 JP20000094519 申请日期 2000.03.30
申请人 TOSHIBA CORP 发明人 NAKAJIMA KAZUAKI
分类号 H01L21/285;H01L21/28;H01L21/768;(IPC1-7):H01L21/285 主分类号 H01L21/285
代理机构 代理人
主权项
地址