发明名称 |
METHOD FOR MANUFACTURING GALLIUM NITRIDE FILM USING PLASMA TREATMENT |
摘要 |
PURPOSE: A fabrication method of a gallium nitride(GaN) film having a high quality is provided to improve an ohmic contact property of the gallium nitride film by using a plasma treatment without using an annealing. CONSTITUTION: After forming a nucleation layer of a gallium nitride(GaN) on a semiconductor substrate, an n-type gallium nitride film is formed by implanting silicon ions into the nucleation layer. Then, the n-type gallium nitride film is carried out by a plasma treatment using N2O gases for a predetermined time. The N2O plasma treatment is performed at the temperature of 10-600°C, in 0.1-2 torr and for 10 seconds - 120 minutes. |
申请公布号 |
KR20010093026(A) |
申请公布日期 |
2001.10.27 |
申请号 |
KR20000015830 |
申请日期 |
2000.03.28 |
申请人 |
KWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
HWANG, HYEON SANG;KIM, HYEON SU;PARK, SEONG JU |
分类号 |
H01L33/12;(IPC1-7):H01L33/00 |
主分类号 |
H01L33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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