发明名称 METHOD FOR MANUFACTURING GALLIUM NITRIDE FILM USING PLASMA TREATMENT
摘要 PURPOSE: A fabrication method of a gallium nitride(GaN) film having a high quality is provided to improve an ohmic contact property of the gallium nitride film by using a plasma treatment without using an annealing. CONSTITUTION: After forming a nucleation layer of a gallium nitride(GaN) on a semiconductor substrate, an n-type gallium nitride film is formed by implanting silicon ions into the nucleation layer. Then, the n-type gallium nitride film is carried out by a plasma treatment using N2O gases for a predetermined time. The N2O plasma treatment is performed at the temperature of 10-600°C, in 0.1-2 torr and for 10 seconds - 120 minutes.
申请公布号 KR20010093026(A) 申请公布日期 2001.10.27
申请号 KR20000015830 申请日期 2000.03.28
申请人 KWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 HWANG, HYEON SANG;KIM, HYEON SU;PARK, SEONG JU
分类号 H01L33/12;(IPC1-7):H01L33/00 主分类号 H01L33/12
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