发明名称 POST-SILICON VALIDATION AND DEBUG USING SYMBOLIC QUICK ERROR DETECTION
摘要 Disclosed are improved methods and structures for verifying integrated circuits and in particular systems-on-a-chip constructed therefrom. We call methods and structures according to the present disclosure Symbolic Quick Error Detection or Symbolic QED, Illustrative characteristics of Symbolic QED include: 1) It is applicable to any System-on-Chip (SoC) design as long as it contains at least one programmable processor; 2) It is broadly applicable for logic bugs inside processor cores, accelerators, and uncore components; 3) It does not require failure reproduction; 4) It does not require human intervention during bug localization; 5) It does not require trace buffers, 6) It does not require assertions; and 7) It uses hardware structures called "change detectors" which introduce only a small area overhead. Symbolic QED exhibits: 1) A systematic (and automated) approach to inserting "change detectors" during a design phase; 2) Quick Error Detection (QED) tests that detect bugs with short error detection latencies and high coverage; and 3) Formal techniques that enable bug localization and generation of minimal bug traces upon bug detection.
申请公布号 WO2016200723(A1) 申请公布日期 2016.12.15
申请号 WO2016US35987 申请日期 2016.06.06
申请人 THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY 发明人 MITRA, Subhasish;BARRETT, Clark;LIN, David;SINGH, Eshan
分类号 G06F11/273;G06F11/30;H01L21/66 主分类号 G06F11/273
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