发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To obtain a high-speed semiconductor device with a low consumption power in which a field-effect transistor is formed on a semiconductor substrate having a good quality embedding oxide film and a large distortion Si layer. SOLUTION: A method for manufacturing a semiconductor device comprises the steps of: forming a first SiGe layer with a low Ge concentration; ion- implanting oxygen into the first SiGe layer to anneal to form an oxide film; forming a second SiGe layer with a higher Ge concentration than the first SiGe layer on the first SiGe layer; forming a distortion Si layer on the second SiGe layer; and forming a field-effect transistor with the distortion Si layer as a channel region.
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申请公布号 |
JP2001332745(A) |
申请公布日期 |
2001.11.30 |
申请号 |
JP20010073514 |
申请日期 |
2001.03.15 |
申请人 |
TOSHIBA CORP |
发明人 |
MIZUNO TOMOHISA;TAKAGI SHINICHI;SUGIYAMA NAOHARU |
分类号 |
H01L21/265;H01L21/02;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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