发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To obtain a high-speed semiconductor device with a low consumption power in which a field-effect transistor is formed on a semiconductor substrate having a good quality embedding oxide film and a large distortion Si layer. SOLUTION: A method for manufacturing a semiconductor device comprises the steps of: forming a first SiGe layer with a low Ge concentration; ion- implanting oxygen into the first SiGe layer to anneal to form an oxide film; forming a second SiGe layer with a higher Ge concentration than the first SiGe layer on the first SiGe layer; forming a distortion Si layer on the second SiGe layer; and forming a field-effect transistor with the distortion Si layer as a channel region.
申请公布号 JP2001332745(A) 申请公布日期 2001.11.30
申请号 JP20010073514 申请日期 2001.03.15
申请人 TOSHIBA CORP 发明人 MIZUNO TOMOHISA;TAKAGI SHINICHI;SUGIYAMA NAOHARU
分类号 H01L21/265;H01L21/02;H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L21/265
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