发明名称 MARK DETECTION METHOD, IMAGE PROCESSING METHOD, MARK DETECTION DEVICE AND POSITIONING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a mark detection method or the like for detecting a discrimination mark formed inconspicuously, on the curved surface of a lens or the like. SOLUTION: This detection device is provided with an illumination system 31 for emitting an illumination beam onto a detection object 10 having the discrimination mark 11 formed on the curved surface, an imaging means 34 for imaging a reflected beam from the surface of the detection object 10, and an image processing part 35 for detecting image information of the discrimination mark imaged by the imaging means 34. The device is composed so that the illumination system 31 is equipped with a minute light source having an illumination region slightly wider than the discrimination mark, and that the irradiation direction of the minute light source has a prescribed angleα, with respect to the normal direction of the curved surface.
申请公布号 JP2002024803(A) 申请公布日期 2002.01.25
申请号 JP20000203733 申请日期 2000.07.05
申请人 SEIKO EPSON CORP 发明人 MIYAO NOBUYUKI
分类号 G06T1/00;H04N7/18;(IPC1-7):G06T1/00 主分类号 G06T1/00
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