发明名称 |
METHOD AND APPARATUS FOR PHASE COMPENSATION OF POSITION SIGNAL AND DETECTION SIGNAL IN SCANNING MICROSCOPIC METHOD AND SCANNING MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To propose plural realizable means capable of easily correcting the time lag between a position signal and a detection signal to users. SOLUTION: This method includes steps of: forming the position signal from the position of a beam deflector (7); and forming the detection signal associated with the position signal from light (17) coming from a sample (15). The position signal and the detection signal are transmitted to a processor (23). The correction values are determined in the processor (23). The correction values are transmitted to a computer (34) in order to compensate the time lag between the position signal and the detection signal.
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申请公布号 |
JP2002131646(A) |
申请公布日期 |
2002.05.09 |
申请号 |
JP20010223124 |
申请日期 |
2001.07.24 |
申请人 |
LEICA MICROSYSTEMS HEIDELBERG GMBH |
发明人 |
ENGELHARDT JOHANN |
分类号 |
G01B21/00;G02B21/00;G02B26/10;(IPC1-7):G02B21/00 |
主分类号 |
G01B21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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