发明名称 METHOD AND APPARATUS FOR PHASE COMPENSATION OF POSITION SIGNAL AND DETECTION SIGNAL IN SCANNING MICROSCOPIC METHOD AND SCANNING MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To propose plural realizable means capable of easily correcting the time lag between a position signal and a detection signal to users. SOLUTION: This method includes steps of: forming the position signal from the position of a beam deflector (7); and forming the detection signal associated with the position signal from light (17) coming from a sample (15). The position signal and the detection signal are transmitted to a processor (23). The correction values are determined in the processor (23). The correction values are transmitted to a computer (34) in order to compensate the time lag between the position signal and the detection signal.
申请公布号 JP2002131646(A) 申请公布日期 2002.05.09
申请号 JP20010223124 申请日期 2001.07.24
申请人 LEICA MICROSYSTEMS HEIDELBERG GMBH 发明人 ENGELHARDT JOHANN
分类号 G01B21/00;G02B21/00;G02B26/10;(IPC1-7):G02B21/00 主分类号 G01B21/00
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