发明名称 COMPOUND FIELD EFFECT SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a gate recess as designed with no current leakage from a gate and low contact resistance of an ohmic electrode, related to an FET comprising the gate recess where a mesa structure is formed to separate elements. SOLUTION: There are provided a laminated semiconductor layer where a field effect transistor is constituted by comprising at least a channel layer 13 and a cap layer 15 with elements isolated after formation into mesa, a first side wall 16, together with its part 16A, comprising SiO2 where a gate electrode drawing part 20A covers an extending mesa side wall, and a second side wall 17 shorter than the first side wall 16 where ohmic electrode drawing parts 18A and 19A are provided at the extending mesa side wall.
申请公布号 JP2002141498(A) 申请公布日期 2002.05.17
申请号 JP20000335561 申请日期 2000.11.02
申请人 FUJITSU LTD 发明人 SAWADA KEN
分类号 H01L29/812;H01L21/338;H01L29/778;(IPC1-7):H01L29/778 主分类号 H01L29/812
代理机构 代理人
主权项
地址