发明名称 COMPOUND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress the warp of a heat sink at the time of assembly to be minimum. SOLUTION: A slit 20 is disposed between insulating boards 13 and 13 which are adjacently placed and fixed on the heat sink 12 used in a compound semiconductor device 1. Stress at the time of basing and at the time of a secular change is relieved with the formation of the slit 20. Warp quantity is relatively reduced, the crack of an insulating substrate is prevented and mechanical stress given to a semiconductor pellet can be reduced.
申请公布号 JP2002184914(A) 申请公布日期 2002.06.28
申请号 JP20000381029 申请日期 2000.12.14
申请人 NIPPON INTER ELECTRONICS CORP 发明人 FUKUDA EIGO
分类号 H01L23/36;(IPC1-7):H01L23/36 主分类号 H01L23/36
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