发明名称 |
COMPOUND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To suppress the warp of a heat sink at the time of assembly to be minimum. SOLUTION: A slit 20 is disposed between insulating boards 13 and 13 which are adjacently placed and fixed on the heat sink 12 used in a compound semiconductor device 1. Stress at the time of basing and at the time of a secular change is relieved with the formation of the slit 20. Warp quantity is relatively reduced, the crack of an insulating substrate is prevented and mechanical stress given to a semiconductor pellet can be reduced.
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申请公布号 |
JP2002184914(A) |
申请公布日期 |
2002.06.28 |
申请号 |
JP20000381029 |
申请日期 |
2000.12.14 |
申请人 |
NIPPON INTER ELECTRONICS CORP |
发明人 |
FUKUDA EIGO |
分类号 |
H01L23/36;(IPC1-7):H01L23/36 |
主分类号 |
H01L23/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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