发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can obtain full pressure resistance. SOLUTION: In the MOS semiconductor device which is formed in an element region defined by element isolation regions 14 formed on a semiconductor substrate 8, covering parts 10 are provided for covering at least ends 22 of the element region, and the covering parts 10 are made of the same material as the material 10 of the side walls of a gate 12.
申请公布号 JP2002252346(A) 申请公布日期 2002.09.06
申请号 JP20010046141 申请日期 2001.02.22
申请人 NEC CORP 发明人 HIGUCHI MINORU
分类号 H01L21/8247;H01L21/76;H01L21/762;H01L21/8234;H01L27/088;H01L27/115;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78;H01L21/823;H01L21/824 主分类号 H01L21/8247
代理机构 代理人
主权项
地址