发明名称 SEMICONDUCTOR DEVICE AND ITS FABRICATING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, and its fabricating method, in which a signal processing transistor can be formed without being influenced by the forming conditions of a PIN diode for photoelectric conversion and the characteristics of the transistor can be adjusted easily. SOLUTION: The semiconductor device comprises a first conductivity type semiconductor substrate 7, an intrinsic semiconductor layer 8, a first semiconductor layer 9 adjusted to second conductivity type, a first impurity layer 11 formed in the first semiconductor layer with first conductivity type, bipolar transistors 3 and 4 formed in the first semiconductor layer, and MIS type transistors 5 and 6. A diode is formed of a multilayer structure of the semiconductor substrate, the intrinsic semiconductor layer and the first semiconductor layer. The semiconductor device further comprises a first insulator layer 13 formed beneath the bipolar transistor at least partially, and a second insulation film layer 14 formed beneath the MIS type transistor at least partally.
申请公布号 JP2002359310(A) 申请公布日期 2002.12.13
申请号 JP20010163204 申请日期 2001.05.30
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIMAZAKI TOYOYUKI;OSAWA KATSUICHI;CHATO TETSUO;SHIMIZU YUZO
分类号 H01L27/14;H01L21/02;H01L21/265;H01L21/76;H01L21/761;H01L21/8222;H01L21/8248;H01L21/8249;H01L27/06;H01L27/12;H01L29/786;H01L31/10;(IPC1-7):H01L21/824;H01L21/822 主分类号 H01L27/14
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