发明名称 CIRCUIT PATTERN INSPECTION DEVICE, CIRCUIT PATTERN INSPECTION METHOD AND STORAGE MEDIUM
摘要 PROBLEM TO BE SOLVED: To provide a circuit inspection device capable of surely and easily detecting defects of a circuit board. SOLUTION: An inspection signal is supplied from a feed part 30 capacity- coupled to conductor patterns 20, arranged in line to one of the conductive patterns 20, the inspection signal is detected by an open sensor 40 capacity- coupled to all other end parts of the line conductor patterns 20, and a pattern disconnection is determined, when the output is largely reduced. The inspection signal is also detected by a short sensor 50 offset to the feed part 30 and capacity-coupled to the pattern parts of two lines of the line conductor patterns 20, and a pattern is determined as having disconnection, when the detection signal is raised or lowered by a large amount, whereby the quality of the pattern is inspected.
申请公布号 JP2002365325(A) 申请公布日期 2002.12.18
申请号 JP20010175381 申请日期 2001.06.11
申请人 OHT INC 发明人 YAMAOKA HIDEJI;ISHIOKA SEIGO
分类号 G01R31/02;G01R31/304;G01R31/312;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R31/02
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