发明名称 EXPOSURE SYSTEM AND METHOD OF EXPOSURE
摘要 PROBLEM TO BE SOLVED: To provide an exposure system capable of efficiently exposing a large-size mask pattern on a photosensitive substrate with a small scanning distance in a short time. SOLUTION: A pattern 11 formed on a mask 10 is exposed onto a photosensitive substrate 20 via a projection lens system while the mask 10 and the photosensitive substrate 20 are synchronistically scanned with respect to the projection lens system in a prescribed scanning direction. A plurality of the projection lens systems 40, 40' are arranged in the scanning direction, while a distance control means 50 is provided, which changes the distance between the projection lens systems depending on the length in the scanning direction of the pattern region formed on the mask. The projection lens systems 40, 40' are respectively constituted of a plurality of projection lens modules 41A-41C, and are arranged in the direction normal to the scanning direction.
申请公布号 JP2003031461(A) 申请公布日期 2003.01.31
申请号 JP20010211046 申请日期 2001.07.11
申请人 NIKON CORP 发明人 HORIKOSHI TAKAHIRO
分类号 G03F7/22;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/22
代理机构 代理人
主权项
地址