发明名称 METHOD OF PROCESSING SILICON AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of processing silicon, which is suitable for forming a fine pattern. SOLUTION: This method of processing silicon includes a step in which a polycrystalline silicon layer is formed on a base surface, a step in which stripe-shaped resist patterns are formed on the polycrystalline silicon layer, a step in which the polycrystalline silicon layer is etched with resist patterns as the mask to form stripe-shaped polycrystalline regions and denaturalized layers are formed on the side walls of the regions, and a step in which the denaturalized layers are removed to obtain finely formed stripe-shaped polycrystalline regions.
申请公布号 JP2003045821(A) 申请公布日期 2003.02.14
申请号 JP20010229824 申请日期 2001.07.30
申请人 FUJITSU LTD 发明人 OTA HIROYUKI
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/3205;H01L21/3213;H01L21/8238;H01L23/52;H01L27/092;H01L29/78;(IPC1-7):H01L21/28;H01L21/320;H01L21/321;H01L21/823;H01L21/306 主分类号 H01L21/28
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