X-RAY LASER MICROSCOPY SYSTEM AND METHOD

摘要

Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample.

主权项

1. An X-ray laser microscopy method, said method comprising:
obtaining an X-ray port capable of supplying a coherent source of X-ray illumination; obtaining a first X-ray optical device configured to focus and/or collimate X-rays; obtaining a sample administrator, detection apparatus, and vacuum chamber, wherein said X-ray port, first X-ray optical device, and said sample administrator are disposed inside said vacuum chamber so that said first X-ray optical device is in between said X-ray port and said sample administrator, and said sample administrator is substantially in between said first X-ray optical device and said detection apparatus; wherein said detection apparatus comprises at least a first outer portion; reducing pressure in said vacuum chamber to a pressure of 10−9 Torr or less and using said sample administrator to control a position of a microscopy sample; chilling said first X-ray optical device to temperatures of 20 degrees Kelvin or less; using said X-ray port to provide a burst of coherent X-rays, and using said first X-ray optical device to focus and/or collimate said burst of coherent X-rays onto said microscopy sample on said sample administrator; using at least a first portion of said detection apparatus to detect a first signal comprising spatially separated X-rays that have been diffracted at various angles from said microscopy sample; and using at least one computer processor and said first signal to reconstruct a likely representation of a structure of said microscopy sample at a nanometer level of resolution.