发明名称 |
Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing |
摘要 |
A power MOSFET 100 has a source metal 112 that contacts silicided source regions 114 through vias 160 etched in an insulating layer 200. The silicide layer 225 provides for a relatively small but highly conductive contact and thus reduces RDSON. The insulating material may be any suitable material including and not limited to one or a combination of materials such as BPSG, PSG, silicon dioxide and silicon nitride. The insulating layer is relatively thin and does not extend deeply into the gate trench, thereby reducing capacitance.
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申请公布号 |
US2003096482(A1) |
申请公布日期 |
2003.05.22 |
申请号 |
US20010044220 |
申请日期 |
2001.11.20 |
申请人 |
HAO JIFA;RIDLEY RODNEY S.;DOLNY GARY M. |
发明人 |
HAO JIFA;RIDLEY RODNEY S.;DOLNY GARY M. |
分类号 |
H01L21/336;H01L29/45;H01L29/49;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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