发明名称 Dense trench MOSFET with decreased etch sensitivity to deposition and etch processing
摘要 A power MOSFET 100 has a source metal 112 that contacts silicided source regions 114 through vias 160 etched in an insulating layer 200. The silicide layer 225 provides for a relatively small but highly conductive contact and thus reduces RDSON. The insulating material may be any suitable material including and not limited to one or a combination of materials such as BPSG, PSG, silicon dioxide and silicon nitride. The insulating layer is relatively thin and does not extend deeply into the gate trench, thereby reducing capacitance.
申请公布号 US2003096482(A1) 申请公布日期 2003.05.22
申请号 US20010044220 申请日期 2001.11.20
申请人 HAO JIFA;RIDLEY RODNEY S.;DOLNY GARY M. 发明人 HAO JIFA;RIDLEY RODNEY S.;DOLNY GARY M.
分类号 H01L21/336;H01L29/45;H01L29/49;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/336
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