发明名称 BIT LINE SENSE STRUCTURE OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A bit line sense structure of a semiconductor memory device is provided to reduce power consumption by reducing an overdrive section of a bit line sense amplifier driver. CONSTITUTION: A level shifter(10) is used for generating the second signal according to the first signal. A bit line sense amplifier controller(20) is used for comparing the second signal of the level shifter and the first output of a sense amplifier driver(30) in order to generate the third signal, and generating the fourth and the fifth signals according to the second signal and a bit line synchronization signal. The sense amplifier driver generates the first and the second outputs according to the bit line synchronization signal, the third, the fourth, and the fifth signals. A bit line sense amplifier(40) is used for performing sensing operations according to the first and the second outputs.
申请公布号 KR20030042674(A) 申请公布日期 2003.06.02
申请号 KR20010073416 申请日期 2001.11.23
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, JUN YEOL
分类号 G11C7/06;(IPC1-7):G11C7/06 主分类号 G11C7/06
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