| 摘要 |
A scan-testing method for circuits having tri-state bus drivers disables all drivers during scan intervals and enables at most one of the bus drivers during the capture interval. A driver select signal is generated for each bus driver and gated with a corresponding circuit functional enable signal to generate a driver enable signal. A driver is selected by loading a driver select code into memory elements during the scan-in sequence and decoding the driver select code to produce the driver select signals. |
