发明名称 CMOS output driver for semiconductor device and related method for improving latch-up immunity in a CMOS output driver
摘要 An output driver circuit for a semiconductor device. In one embodiment, the output driver is coupled to an output terminal of the semiconductor device and consists of an N-channel pull-down transistor and a P-channel pull-up transistor formed in an N-well in a P-type substrate. A tie-down region formed in the N-well is selectively coupled to a supply potential by means of a decoupling transistor, and during normal operation of the driver maintains the supply voltage bias of the N-well. An overdrive detection circuit is coupled to the output terminal. Upon detection of an overdrive condition on the output terminal, such as a voltage exceeding a predetermined maximum, or excessive current injected into the output terminal (or both), the overdrive detection circuit deasserts a control signal applied to the gate of the decoupling transistor, thereby decoupling the N-well from the supply potential. In one embodiment, the decoupling transistor is not coupled to the output terminal.
申请公布号 US6624660(B2) 申请公布日期 2003.09.23
申请号 US20010010820 申请日期 2001.12.06
申请人 MICRON TECHNOLOGY, INC. 发明人 LI WEN;CHAINE MICHAEL D.;MA MANNY KIN
分类号 H03K19/003;(IPC1-7):H03K19/094;H03K3/01;H03K19/017 主分类号 H03K19/003
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