发明名称 |
REFERENCE PLATE HOUSING TYPE SPECIMEN SUPPORTING STAGE, SPECIMEN WAVE FRONT MEASURING DEVICE USING THE SAME AND MEASURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To quickly and safely perform the installation exchange of a reflection type reference plate and a specimen to a measuring part and the measurement of a surface to be tested and to lower costs by combining a reference plate housing part housing the reflection type reference plate and a lid body supporting the specimen and mounting the reflection type reference plate on an elastic sheet spread inside the reference plate housing part. SOLUTION: An interferometer device 100 is composed of a laser interferometer body 1, a sample stage 10 and a computer part 20 performing the analysis operation of interference fringe image data. The sample stage 10 is provided with the reference plate housing part 9 in the shape of a container with a bottom part and a sheet 5 for mounting the reflection type reference plate 4 is spread at the bottom part of the inner chamber 11 of the reference plate housing part 9. As the lid body closing the upper part of the inner chamber 11, a sample supporting part 3 is freely attachably and detachably arranged. The sample supporting part 3 is supported by a rib 12 provided around the upper part of the inner wall part of the inner chamber 11 and disposed so as to provide a clearance 13 between the bottom surface and the reflection type reference plate 4 in that state. COPYRIGHT: (C)2004,JPO
|
申请公布号 |
JP2003279859(A) |
申请公布日期 |
2003.10.02 |
申请号 |
JP20020087519 |
申请日期 |
2002.03.27 |
申请人 |
FUJI PHOTO OPTICAL CO LTD |
发明人 |
UEKI NOBUAKI |
分类号 |
G01B9/02;G02B21/00;G02B21/26;(IPC1-7):G02B21/00 |
主分类号 |
G01B9/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|