| 摘要 |
PURPOSE: A test pattern for measuring insulating film thickness of an LCD device is provided to expose a portion of each thin film that configures a storage capacitor, thereby easily measuring thickness of an insulating film. CONSTITUTION: A mother board(200) is divided into a test pattern area and a panel area. A storage capacitor electrode(310) is formed in the test pattern area of the mother board(200). An insulating film(320) is formed in an upper part of the storage capacitor electrode(310) so that a portion of the storage capacitor electrode(310) can be exposed. A pixel electrode(330) is formed in an upper part of the insulating film(320) so that the portion of the storage capacitor electrode(310) and a portion of the insulating film(320) can be exposed. |
