System and method for testing integrated circuits by transient signal analysis

摘要

A system and method for testing an integrated circuit (IC) by transient signal analysis includes a comparison circuit that is configured to generate a comparison signal from an IC transient signal and a reference signal. Circuitry operationally coupled to the comparison circuit manipulates the comparison signal to generate a first output waveform area indicative of an absolute area of positive and negative portions within the comparison signal. The comparison circuit and the circuitry may include seven operational-amplifiers (op-amps) or ten op-amps. As a further processing sequence, a second output waveform area that is indicative of an absolute area of positive and negative portions within a second comparison signal is generated. In one embodiment, a first value representing the first waveform area and a second value representing the second waveform area are plotted to determine if the plotted X-Y coordinate falls within a predefined standard for determining the pass/fail status of the IC.